A composition and thickness analysis spectrometer specially designed for detecting various special-shaped parts, especially hardware molds, sanitary products, circuit boards and surface treatment of high-precision electronic components.
It is widely used in quality control of various products, incoming material verification and measurement of production process control.
Equipped with a micro-focus X-ray generator and an advanced optical path conversion focusing system, it has non-destructive zoom detection technology, with a minimum measurement area of 0.01mm²
Manual zoom function, can be used for non-destructive testing of various special-shaped groove parts,
The core EFP algorithm can quickly, accurately and stably analyze data for multiple layers and multiple elements. The optional high-precision micro-mobile slide can achieve accurate displacement and simultaneous detection of multiple points and samples. It can analyze 23 coatings and 24 elements at the same time. The measuring element range is: chlorine Cl(17)-uranium U(92), the coating analysis range is: lithium Li(3)-uranium U(92), and the minimum detection limit of coating is: 0.005μm. Humanized closed software automatically judges faults and prompts correction and operation steps to avoid misoperation.
Standard φ0.2mm collimator
Equipped with micro-light focusing technology, the closest distance spot diffusion is less than 10%